National Intellectual Property Administration (CNIPA)
Patent Search and Analysis
Patent search tool by National Intellectual Property Administration, PRC.
European Patent Office (EPO)
Espacenet
European Patent Office patent search tool with access to information about inventions and technical developments from the 19th century to the present.
United States Patent and Trademark Office (USPTO)
Patent Full-Text and Image Database (PatFT)
United States Patent and Trademark Office patent search.
PATFT starts from 1790.
AppFT starts from March 2001.
Japan Patent Office (JPO)
Japan Platform for Patent Information (J-PlatPat)
Access to patent information including utility-model, design, trademark, etc. Provided by The Japan Patent Office (JPO) and the National Center for Industrial Property Information and Training (INPIT).
Korean Intellectual Property Office (KIPO)
Korean Intellectual Property Rights Information Service (KIPRIS)
Searches for patents, trademarks and designs.
World Intellectual Property Office (WIPO)
PATENTSCOPE
Searchable database of more than 35 million international and national patent documents. "Provides access to international Patent Cooperation Treaty (PCT) applications in full text format on the day of publication. The information may be searched by entering keywords, names of applicants, international patent classification and many other search criteria in multiple languages."
Subscribed by XJTLU Library
Patsnap Analytics is a global patent and innovation database that provides users with a comprehensive and user-friendly platform for conducting patent searches. PatSnap Analytics connects 116 jurisdictions, 140 million patents, and 250+ million innovation data points from around the world. With PatSnap Analytics, you can perform highly targeted global searches that generate reliable detailed innovation intelligence that can help you manage risk, spot new opportunities, defend your innovations and keep an eye on the competitive landscape.
NOTICE: Please visit https://account.zhihuiya.com/public/#/register and use your XJTLU email to register an account and access to the database. If you need to access advanced analysis functions in PatSnap, you can come to Research Common at Level 9 in XJTLU Library and use the designated desktop.
Derwent Innovations Index (DII) is a research tool that provides web access to more than 30 million inventions detailed in over 65 million patent documents. It includes links to cited and citing patents, cited articles, and full-text patent data sources. In addition, Derwent Innovations Index opens the power of patent searching to all levels of an organization, allowing you to browse patent records by entering simple search queries. Coverage includes patent records from Derwent World Patents Index and patent citation information from Derwent Patents Citation Index.
Reaxys is a unique web-based chemistry database consisting of deeply excerpted compounds and related factual properties, reaction and synthesis information as well as bibliographic data, navigated and displayed via an actionable interface. It is an online information solution aimed at the field of chemical research. Reaxys currently sources its data from: 16,300 chemistry-related journals; patents from 105 patent authorities; chapter content from 300,000 books; commercial data from 425 suppliers and platforms. The information refined from these sources by Reaxys includes: over 95 million records and abstracts of journals and patents, more than 58 million reaction synthesis routes and conditions, 1.7 billion compound structure information, and over 500 million pieces of physical and chemical property data.
NOTICE: Reaxys is a professional research tool that requires users to be equipped with advanced searching skills. Refer to the PDF file for detailed guide.
Freely Available Online
Patent search and online research community - developing tools to make searching world’s patent data easier and more convenient
Fast, easy-to-use access to millions of patents with free PDF download
Patent Lens is a worldwide, open-access, free full-text patent informatics resource.